Dao, T. and Pham, T. 2014. Influence of annealing temperature on reversible resistive switching of WOx thin filmsdeposited on FTO substrate. Science and Technology Development Journal. 17, 3 (Sep. 2014), 12-18. DOI:https://doi.org/https://doi.org/10.32508/stdj.v17i3.1366.