Nguyen, T., Dao, V. T., Pham, K. N., Ta, T. K. H., Le, T., Tran, T., Le, V. H., Lee, J., Dang, M. C., & Phan, B. T. (2013). Resistance switching behavior of ZnO thin films for random access memory applications. Science and Technology Development Journal, 16(1), 81-85. https://doi.org/https://doi.org/10.32508/stdj.v16i1.1422