NGUYEN, T.; DAO, V. T.; PHAM, K. N.; TA, T. K. H.; LE, T.; TRAN, T.; LE, V. H.; LEE, J.; DANG, M. C.; PHAN, B. T. Resistance switching behavior of ZnO thin films for random access memory applications. Science and Technology Development Journal, v. 16, n. 1, p. 81-85, 31 mar. 2013.