Tuan Hung, Le, Nguyen Van Den, and Huynh Thanh Dat. 2006. “STUDYING OPTIMAL PARAMETERS OF TiO2 AND SiO2 THIN FILMS TO PREPARE FOR ANTI-REFLECTION COATING”. Science and Technology Development Journal 9 (9), 55-62. https://doi.org/https://doi.org/10.32508/stdj.v9i9.3101.