Nguyen, T., V. T. Dao, K. N. Pham, T. K. H. Ta, T. Le, T. Tran, V. H. Le, J. Lee, M. C. Dang, and B. T. Phan. “Resistance Switching Behavior of ZnO Thin Films for Random Access Memory Applications”. Science and Technology Development Journal, Vol. 16, no. 1, Mar. 2013, pp. 81-85, doi:https://doi.org/10.32508/stdj.v16i1.1422.