Tuan Hung, Le, and Nguyen Van Den. “CACULATING THE OPTIMAL THICKNESS FOR THE ANTIREFLECTION DIELECTRIC MULTILAYER THIN FILMS IN INFRARED REGION BY N-SQUARE SCAN METHOD”. Science and Technology Development Journal 7, no. 4&5 (May 31, 2004): 22-38. Accessed December 22, 2024. http://stdj.scienceandtechnology.com.vn/index.php/stdj/article/view/3193.