Nguyen T, Dao VT, Pham KN, Ta TKH, Le T, Tran T, Le VH, Lee J, Dang MC, Phan BT. Resistance switching behavior of ZnO thin films for random access memory applications. Science and Technology Development Journal [Internet]. 31Mar.2013 [cited 22Jul.2024];16(1):81-5. Available from: http://stdj.scienceandtechnology.com.vn/index.php/stdj/article/view/1422