1.
Tuan Hung L, Van Den N, Thanh Dat H. STUDYING OPTIMAL PARAMETERS OF TiO2 AND SiO2 THIN FILMS TO PREPARE FOR ANTI-REFLECTION COATING. Science and Technology Development Journal [Internet]. 30Sep.2006 [cited 19May2024];9(9):55-2. Available from: http://stdj.scienceandtechnology.com.vn/index.php/stdj/article/view/3101