Tuan Hung, L. and Van Den, N. (2004) “CACULATING THE OPTIMAL THICKNESS FOR THE ANTIREFLECTION DIELECTRIC MULTILAYER THIN FILMS IN INFRARED REGION BY N-SQUARE SCAN METHOD”, Science and Technology Development Journal, 7(4&5), pp. 22-38. doi: https://doi.org/10.32508/stdj.v7i4&5.3193.