Tuan Hung, L., and N. Van Den. “CACULATING THE OPTIMAL THICKNESS FOR THE ANTIREFLECTION DIELECTRIC MULTILAYER THIN FILMS IN INFRARED REGION BY N-SQUARE SCAN METHOD”. Science and Technology Development Journal, Vol. 7, no. 4&5, May 2004, pp. 22-38, doi:https://doi.org/10.32508/stdj.v7i4&5.3193.