Downloads
Abstract
In recent years, glancing angle deposition technic (GLAD) is interested by many scientists. GLAD can fabricate many thin films which are used in variours applications. GLAD thin films with zigzag structure have the same optical characteristics with multi−layer thin films, so we can use them to fabricate optical thin films, such as AR or filters. In this report, basing on GLAD, we use Genetic algorithms to simulate AR thin film in visible region with TiO2 and MgF2 materials. The results from our simulating program can create a lot of advantages in studying optical thin films.
Issue: Vol 11 No 10 (2008)
Page No.: 34-42
Published: Oct 31, 2008
Section: Natural Sciences - Research article
DOI: https://doi.org/10.32508/stdj.v11i10.2699
Download PDF = 293 times
Total = 293 times
Most read articles by the same author(s)
- Vu Thi Hanh Thu, Dinh Cong Truong, Nguyen Huu Chi, Le Van Hieu, Huynh Thanh Dat, Pham Kim Ngoc, Le Dinh Minh Tri, NITROGEN DOPED TITANIUM DIOXIDE FILMS MECHANISM PREPARED BY REACTIVE DC MAGNETRON , Science and Technology Development Journal: Vol 11 No 6 (2008)
- Le Van Ngoc, Le Quang Tri, Tran Tuan, Huynh Thanh Dat, Duong Ai Phuong, Nguyen Van Den, STUDYING ELECTROCHROMIC AND ELECTROCHEMISTRY CHARACTERISTICS OF WO3 THIN FILM , Science and Technology Development Journal: Vol 11 No 6 (2008)
- Giang Van Phuc, Le Vu Tuan Hung, Huynh Thanh Dat, Nguyen Van Den, MODELING AND SIMULATION OF THE MAGNETRON SPUTTERING PROCESS FOR Al2O3 THIN FILM COATING , Science and Technology Development Journal: Vol 10 No 3 (2007)
- Le Vu Tuan Hung, Nguyen Van Den, Huynh Thanh Dat, Ta Thi Kieu Hanh, DETERMINING THE CRYSTALLIZATION BEHAVIOR OF TiO2-SiO2 MIXED COMPOSITION FILMS , Science and Technology Development Journal: Vol 9 No 1 (2006)
- Le Vu Tuan Hung, Huynh Thanh Dat, Nguyen Van Den, Ta Thi Kieu Hanh, DETERMINING THE CRYSTALLIZATION BEHAVIOR OF TiO2-SiO2 MIXED COMPOSITION FILMS , Science and Technology Development Journal: Vol 9 No 4 (2006)
- Le Vu Tuan Hung, Nguyen Van Den, Huynh Thanh Dat, STUDY OF TITANIUM DIOXIDE THIN FILMS PREPARED BY RF MAGNETRON SPUTTERING , Science and Technology Development Journal: Vol 9 No 6 (2006)
- Le Vu Tuan Hung, Nguyen Van Den, Huynh Thanh Dat, STUDYING OPTIMAL PARAMETERS OF TiO2 AND SiO2 THIN FILMS TO PREPARE FOR ANTI-REFLECTION COATING , Science and Technology Development Journal: Vol 9 No 9 (2006)
- Nguyen Thi Thu Thuy, Duong Ai Phuong, Nguyen Van Den, R.K. Mamedov, V.I. Zolatarov, STUDYING FILM OF POLYMER, PAPER AND OPTICAL FIBER BY METHOD ATTENUATED TOTAL REFLECTION , Science and Technology Development Journal: Vol 3 No 1 (2000)
- Nguyen Van Dinh, Duong Ai Phuong, Nguyen Van Den, ANALYSE MERCURY BY TECHNIQUE OF COLD VAPOR SYSTEM AND USING T-ABSORPTION CELL EQUIPPED WITH MVU-1A , Science and Technology Development Journal: Vol 3 No 5&6 (2000)
- Nguyen Thi Thu Thuy, Duong Ai Phuong, Nguyen Van Den, R.K. Mamedov, V.I. Zolatarov, SOME REAL CONDITIONS OF STUDYING FILM OF POLYMER, PAPER AND OPTICAL FIBER BY METHOD ATTENUATED TOTAL REFLECTION , Science and Technology Development Journal: Vol 3 No 5&6 (2000)