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Abstract
The antireflection multilayer thin film is technologically an important topic in recent years. With the development of technology and science in manufacture thin film especially multilayer thin film, hundreds of research papers have been written on AR coating. In this paper, we emphasize to study the antireflection multilayer thin films from near infrared to far infrared region because they have a lot of applications for spaceflight optical lens. Futhermore, there are available optical materials such as semiconductors with high refractive index used in infrared region. In our study, we use matlab language based flip flop method to determine optimal combination of refractive index for antireflection multilayer thin film in infrared region.
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Article Details
Issue: Vol 7 No 6 (2004)
Page No.: 5-10
Published: Jun 30, 2004
Section: Article
DOI: https://doi.org/10.32508/stdj.v7i6.3211
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Copyright: The Authors. This is an open access article distributed under the terms of the Creative Commons Attribution License CC-BY 4.0., which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.
How to Cite
Tuan Hung, L., Van Den, N., & Thu Hoa, T. (2004). DETERMINING THE OPTIMAL COMBINATION OF REFRACTIVE INDEX FOR ANTI-REFLECTION MULTILAYER THIN FILMS IN INFRARED REGION BY FLIP-FLOP METHOD. Science and Technology Development Journal, 7(6), 5-10. https://doi.org/https://doi.org/10.32508/stdj.v7i6.3211
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