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DETERMINING THE OPTIMAL COMBINATION OF REFRACTIVE INDEX FOR ANTI-REFLECTION MULTILAYER THIN FILMS IN INFRARED REGION BY FLIP-FLOP METHOD

Le Vu Tuan Hung 1
Nguyen Van Den 1
Truong Thi Thu Hoa 1
Volume & Issue: Vol. 7 No. 6 (2004) | Page No.: 5-10 | DOI: 10.32508/stdj.v7i6.3211
Published: 2004-06-30

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Copyright The Author(s) 2023. This article is published with open access by Vietnam National University, Ho Chi Minh city, Vietnam. This article is distributed under the terms of the Creative Commons Attribution License (CC-BY 4.0) which permits any use, distribution, and reproduction in any medium, provided the original author(s) and the source are credited. 

Abstract

The antireflection multilayer thin film is technologically an important topic in recent years. With the development of technology and science in manufacture thin film especially multilayer thin film, hundreds of research papers have been written on AR coating. In this paper, we emphasize to study the antireflection multilayer thin films from near infrared to far infrared region because they have a lot of applications for spaceflight optical lens. Futhermore, there are available optical materials such as semiconductors with high refractive index used in infrared region. In our study, we use matlab language based flip flop method to determine optimal combination of refractive index for antireflection multilayer thin film in infrared region.

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