Downloads
Download data is not yet available.
Abstract
In recent years, method attenuated total reflection has been applied popularly From some results of spectra of polymer, paper, optical fiber by this method, we have some conclusions of using the method and some their characteristics and properties.
Author's Affiliation
Article Details
Issue: Vol 3 No 1 (2000)
Page No.: 53-61
Published: Jan 31, 2000
Section: Article
DOI: https://doi.org/10.32508/stdj.v3i1.3527
How to Cite
Thu Thuy, N., Ai Phuong, D., Van Den, N., Mamedov, R., & Zolatarov, V. (2000). STUDYING FILM OF POLYMER, PAPER AND OPTICAL FIBER BY METHOD ATTENUATED TOTAL REFLECTION. Science and Technology Development Journal, 3(1), 53-61. https://doi.org/https://doi.org/10.32508/stdj.v3i1.3527
Download Citation
Article Statistics
HTML = 1162 times
Download PDF = 366 times
Total = 366 times
Download PDF = 366 times
Total = 366 times
Most read articles by the same author(s)
- Le Van Ngoc, Le Quang Tri, Tran Tuan, Huynh Thanh Dat, Duong Ai Phuong, Nguyen Van Den, STUDYING ELECTROCHROMIC AND ELECTROCHEMISTRY CHARACTERISTICS OF WO3 THIN FILM , Science and Technology Development Journal: Vol 11 No 6 (2008)
- Le Vu Tuan Hung, Ho Van Binh, Giang Van Phuc, Duong Ai Phuong, Le Son Hai, Huynh Thanh Dat, SIMULATION ANTI−REFLECTION (AR) THIN FILM FROM GLANCING ANGLE DEPOSITION BY GENETIC ALGORITHMS , Science and Technology Development Journal: Vol 11 No 10 (2008)
- Le Vu Tuan Hung, Nguyen Van Den, Huynh Thanh Dat, Ta Thi Kieu Hanh, DETERMINING THE CRYSTALLIZATION BEHAVIOR OF TiO2-SiO2 MIXED COMPOSITION FILMS , Science and Technology Development Journal: Vol 9 No 1 (2006)
- Le Vu Tuan Hung, Huynh Thanh Dat, Nguyen Van Den, Ta Thi Kieu Hanh, DETERMINING THE CRYSTALLIZATION BEHAVIOR OF TiO2-SiO2 MIXED COMPOSITION FILMS , Science and Technology Development Journal: Vol 9 No 4 (2006)
- Le Vu Tuan Hung, Nguyen Van Den, Huynh Thanh Dat, STUDY OF TITANIUM DIOXIDE THIN FILMS PREPARED BY RF MAGNETRON SPUTTERING , Science and Technology Development Journal: Vol 9 No 6 (2006)
- Le Vu Tuan Hung, Nguyen Van Den, Huynh Thanh Dat, STUDYING OPTIMAL PARAMETERS OF TiO2 AND SiO2 THIN FILMS TO PREPARE FOR ANTI-REFLECTION COATING , Science and Technology Development Journal: Vol 9 No 9 (2006)
- Nguyen Van Den, STUDYING THE COATED PAPER USING THE METHOD OF HATR , Science and Technology Development Journal: Vol 5 No 7&8 (2002)
- Nguyen Van Dinh, Duong Ai Phuong, Nguyen Van Den, ANALYSE MERCURY BY TECHNIQUE OF COLD VAPOR SYSTEM AND USING T-ABSORPTION CELL EQUIPPED WITH MVU-1A , Science and Technology Development Journal: Vol 3 No 5&6 (2000)
- Nguyen Thi Thu Thuy, Duong Ai Phuong, Nguyen Van Den, R.K. Mamedov, V.I. Zolatarov, SOME REAL CONDITIONS OF STUDYING FILM OF POLYMER, PAPER AND OPTICAL FIBER BY METHOD ATTENUATED TOTAL REFLECTION , Science and Technology Development Journal: Vol 3 No 5&6 (2000)
- Nguyen Thi Thu Thuy, Duong Ai Phuong, Nguyen Van Den, Mamedov R. K., Zolatarov V. M., STUDYING QUALITY OF THIN FILM OF POLYPYROMELLITIMIDE, PAPER BY METHOD ATTENUATED TOTAL REFLECTION (ATR) WITH THE HELP OF OPTICAL CONTACT , Science and Technology Development Journal: Vol 3 No 9&10 (2000)