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Abstract

Exfoliative toxins (ETs), the toxin caused the dangerous Staphylococcal scalded skin syndrome (SSSS), mainly affect on infants and young children [1]. By examining the ratio of antibiotic resistance and the detection of rate eta, etb genes encoding ETs toxins that cause disease in the group of Staphylococcus aureus (S. aureus), we would like to draw conclusions about the relationship between the disease gene with the antibiotic resistance of S. aureus thereby affording an appropriate choice of antibiotic to physicians, reduce the risk of spreading Methicillin resistant Staphylococcus aureus (MRSA) strains present in the community. In this study, we determine antibiotic susceptibility of S. aureus by Kirby-Bauer method on 293 S. aureus isolates from clinical specimens at the Department of Clinical Biology, Pasteur Institute HCMC. In total 293 S. aureus strains studied, we identified 49.7 % of MRSA strains the conduction PCR with primers specific detection of eta, etb gene that encoding toxins ETs applying on 118 strains S. aureus, discovered 4/118 (3.4 %) S. aureus trains carrying the gene eta, 1/118 (0.8 %) S. aureus trains carrying the gene etb. Because of the small presence of S. aureus strains carrying the genes encoding ETs the relationship between the gene for ET toxins and antibiotic resistance in S. aureus was not clearly defined.



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Article Details

Issue: Vol 19 No 2 (2016)
Page No.: 15-23
Published: Jun 30, 2016
Section: Natural Sciences - Research article
DOI: https://doi.org/10.32508/stdj.v19i2.755

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Creative Commons License

Copyright: The Authors. This is an open access article distributed under the terms of the Creative Commons Attribution License CC-BY 4.0., which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.

 How to Cite
Phan, T., Vu, L., Uong, N., & Cao, N. (2016). Investigation of the antibiotic resistance prevalence and genes encoding exfoliative toxins of Staphylococcus aureus isolated from Pasteur institude HCMC. Science and Technology Development Journal, 19(2), 15-23. https://doi.org/https://doi.org/10.32508/stdj.v19i2.755

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